Anunțul 630159-2026 pentru Finlanda – Instrumente de măsurare – Kelvin probe force microscopy (KPFM) este publicat de VTT Technical Research Centre of Finland Ltd și este încadrat la codul CPV 38300000.
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Finlanda – Instrumente de măsurare – Kelvin probe force microscopy (KPFM)
NOTICE type
can-standard
NOTICE version
1
Procedure accelerated
false
Procedure features
The tender process was based on the open procedure applicable to contracts that exceed the EU procurement threshold.
Procedure identifier
9254dad3-1129-469d-83fc-aab1c11fe69e
Procedure type
open
Rezultate, atribuiri și contracte14
Award criterion description LOT
The evaluation of the tenders is described in section 'Grounds for decision' in the invitation to tender.
Award criterion number LOT
50 | 50
Award criterion number weight LOT
per-exa | per-exa
Award criterion type LOT
price | quality
Contract conclusion date
2026-09-10Z
Contract duration period LOT
6
Contract identifier
EQUIPMENT PURCHASE AGREEMENT - Kelvin Probe Force Microscopy
Contract nature
supplies | supplies
Contract nature main LOT
Organizații și puncte de contact61
Organisation city addinfo LOT
Espoo
Organisation city buyer
Espoo
Organisation city revieworg LOT
Helsinki
Organisation city signatory
Espoo
Organisation city ted esen
Helsinki
Organisation city tenderer
LES ULIS
Organisation contact point addinfo LOT
VTT Technical Research Centre of Finland Ltd
Organisation contact point buyer
VTT Technical Research Centre of Finland Ltd
Organisation contact point signatory
Autoritate contractantă12
Authority main activity
econ-aff
Buyer city
Espoo
Buyer contact point
VTT Technical Research Centre of Finland Ltd
Buyer country
FIN
Buyer country sub
FI1B1
Buyer email
[email eliminat]
Buyer identifier
2647375-4
Buyer internet address
https://www.vttresearch.com/fi
Buyer legal type
pub-undert
Buyer name
VTT Technical Research Centre of Finland Ltd
Loc de executare7
Place of performance
FI1B1 | FIN | FI1B1 | FIN
Place of performance add PROC
Please see invitation to tender.
Place of performance addtional LOT
Please see invitation to tender.
Place of performance country LOT
FIN
Place of performance country PROC
FIN
Place of performance subdiv LOT
FI1B1
Place of performance subdiv PROC
FI1B1
Câștigători și oferte8
Winner city
LES ULIS
Winner country
FRA
Winner country sub
FR101
Winner identifier
[telefon eliminat].
Winner name
Concept Scientific Instruments
Winner post code
91940
Winner selection status
selec-w
Winner size
sme
Alte informații publicate27
Acquiring cpb buyer
false
Additional info PROC
The objective was to find one professional supplier that could supply high-quality equipment, equipment installation, and user training. VTT Technical Research Centre of Finland Ltd chose one supplier from among the tenderers.
Awarding cpb org
false
Competition termination PROC
false
Customization id
eforms-sdk-1.13
Description PROC
The object of the tender process was a Kelvin probe force microscopy (KPFM) equipped with atomic force microscopy (AFM) functionality, a state-of-the-art detector system, and equipment for advanced material surface potential mapping with an efficient spatial resolution and a minimum of topographical artifacts (later also “Equipment”). The equipment supports both AM- and FM-KPFM modes, operate with a potential range up to ±10 V, with a reasonable spatial resolution. The applied voltage is from a few hundred millivolts to a few volts (approximately 1-2 V) for AC and DC, and the device is equipped with advanced control electronics and software for quantitative analysis. An integrated cooling and heating control with a large temperature range (from possibly -30°C up to +90°C) in both air and liquid environments was required to enable in-situ studies under variable atmospheric conditions. The system provides stable scanning, possibly flexible imaging modes of tapping and/or non-contacting, and compatibility with applications across metals and energy materials. Because of this, the system allows large samples with complex topography. The technical specification of the equipment and the tender process to be supplied was discussed in more detail in the invitation to tender documents. The object of the tender process was described in more detail in the invitation to tender documents.
Acord-cadru și sistem dinamic2
Dps usage LOT
none
Framework agreement LOT
none
Loturi10
Additional information LOT
The objective was to find one professional supplier that could supply high-quality equipment, equipment installation, and user training. VTT Technical Research Centre of Finland Ltd chose one supplier from among the tenderers.
Clean vehicles directive LOT
false
Description LOT
The object of the tender process was a Kelvin probe force microscopy (KPFM) equipped with atomic force microscopy (AFM) functionality, a state-of-the-art detector system, and equipment for advanced material surface potential mapping with an efficient spatial resolution and a minimum of topographical artifacts (later also “Equipment”). The equipment supports both AM- and FM-KPFM modes, operate with a potential range up to ±10 V, with a reasonable spatial resolution. The applied voltage is from a few hundred millivolts to a few volts (approximately 1-2 V) for AC and DC, and the device is equipped with advanced control electronics and software for quantitative analysis. An integrated cooling and heating control with a large temperature range (from possibly -30°C up to +90°C) in both air and liquid environments was required to enable in-situ studies under variable atmospheric conditions. The system provides stable scanning, possibly flexible imaging modes of tapping and/or non-contacting, and compatibility with applications across metals and energy materials. Because of this, the system allows large samples with complex topography. The technical specification of the equipment and the tender process to be supplied was discussed in more detail in the invitation to tender documents. The object of the tender process was described in more detail in the invitation to tender documents.
Electronic auction LOT
false
Termene și durate2
Duration period unit LOT
MONTH
Duration period value LOT
6
Clasificare CPV5
Classification cpv
38300000 | 38300000
Main classification LOT
38300000
Main classification PROC
38300000
Main classification type LOT
cpv
Main classification type PROC
cpv
Valori2
Total value
177100
Total value CUR
EUR
Căi de atac1
Review deadline description LOT
The appeal period is determined in accordance with the Act on Public Procurement and Concession Contracts (1397/2016).
Date de contact publicate în TED
16
Contactele sunt disponibile utilizatorilor autentificați.Autentifică-te
Textul integral publicat de TEDextinde
The tender process was based on the open procedure applicable to contracts that exceed the EU procurement threshold.
Hansel Oy (Hilma)
Markkinaoikeus
The evaluation of the tenders is described in section 'Grounds for decision' in the invitation to tender.
The objective was to find one professional supplier that could supply high-quality equipment, equipment installation, and user training. VTT Technical Research Centre of Finland Ltd chose one supplier from among the tenderers.
Concept Scientific Instruments
The object of the tender process was a Kelvin probe force microscopy (KPFM) equipped with atomic force microscopy (AFM) functionality, a state-of-the-art detector system, and equipment for advanced material surface potential mapping with an efficient spatial resolution and a minimum of topographical artifacts (later also “Equipment”). The equipment supports both AM- and FM-KPFM modes, operate with a potential range up to ±10 V, with a reasonable spatial resolution. The applied voltage is from a few hundred millivolts to a few volts (approximately 1-2 V) for AC and DC, and the device is equipped with advanced control electronics and software for quantitative analysis. An integrated cooling and heating control with a large temperature range (from possibly -30°C up to +90°C) in both air and liquid environments was required to enable in-situ studies under variable atmospheric conditions. The system provides stable scanning, possibly flexible imaging modes of tapping and/or non-contacting, and compatibility with applications across metals and energy materials. Because of this, the system allows large samples with complex topography. The technical specification of the equipment and the tender process to be supplied was discussed in more detail in the invitation to tender documents. The object of the tender process was described in more detail in the invitation to tender documents.
VTT Technical Research Centre of Finland Ltd
Kelvin probe force microscopy (KPFM)
The appeal period is determined in accordance with the Act on Public Procurement and Concession Contracts (1397/2016).
Please see invitation to tender.
FI1B1
01 ••• ••• 14+02:00
selec-w
[email eliminat]
00520
[telefon eliminat]
none
Mannerheiminaukio 1a
http://hankintailmoitukset.fi
t-oth-eea
LES ULIS
supplies
price
ORG-00 ••• ••• 26
ORG-0004
tenderReference-4788164-949073
[telefon eliminat]
pub-undert
50
09:43:36+00:00
ORG-0001
ORG-[telefon eliminat]
EUR
FR101
CON-0001
9254dad3-1129-469d-83fc-aab1c11fe69e
https://www.vttresearch.com/fi
no-eu-funds
quality
32014L0024
1
per-exa
2647375-4
6
can-standard
true
2000-01-01Z
P.O. Box 1000, VTT
177100
d4ccdef6-c4d3-4667-a3b0-d38de4639c97
ENG
http://www.oikeus.fi/markkinaoikeus
Espoo
eSender
no
29
TEN-0001
sme
00100
eforms-sdk-1.13
RES-[telefon eliminat]+00:00
LOT-[telefon eliminat]
[email eliminat]
TPA-0001
f17d3fdc-408c-42ab-b7e9-8a785b64551f-01
Helsinki
EQUIPMENT PURCHASE AGREEMENT - Kelvin Probe Force Microscopy
FI09880841
[telefon eliminat]Z
91940
false
Reg.no. 59/206/2025
FIN
hum-right
FRA
2.3
38300000
09:43:37+00:00
econ-aff
ted-esen
2, rue de la Terre de Feu
open
Radanrakentajantie 5
[email eliminat]
Loturi TED
1
Reg.no. 59/206/2025
Kelvin probe force microscopy (KPFM)
The object of the tender process was a Kelvin probe force microscopy (KPFM) equipped with atomic force microscopy (AFM) functionality, a state-of-the-art detector system, and equipment for advanced material surface potential mapping with an efficient spatial resolution and a minimum of topographical artifacts (later also “Equipment”). The equipment supports both AM- and FM-KPFM modes, operate with a potential range up to ±10 V, with a reasonable spatial resolution. The applied voltage is from a few hundred millivolts to a few volts (approximately 1-2 V) for AC and DC, and the device is equipped with advanced control electronics and software for quantitative analysis. An integrated cooling and heating control with a large temperature range (from possibly -30°C up to +90°C) in both air and liquid environments was required to enable in-situ studies under variable atmospheric conditions. The system provides stable scanning, possibly flexible imaging modes of tapping and/or non-contacting, and compatibility with applications across metals and energy materials. Because of this, the system allows large samples with complex topography. The technical specification of the equipment and the tender process to be supplied was discussed in more detail in the invitation to tender documents. The object of the tender process was described in more detail in the invitation to tender documents.
38300000 — Instrumente de masurare
Durată: 6 MONTH
Rezultate și atribuiri TED
LOT-0000177.100,00 EUR
Câștigător: Concept Scientific Instruments · CUI 00 ••• ••• 30.
The object of the tender process was a Kelvin probe force microscopy (KPFM) equipped with atomic force microscopy (AFM) functionality, a state-of-the-art detector system, and equipment for advanced material surface potential mapping with an efficient spatial resolution and a minimum of topographical artifacts (later also “Equipment”). The equipment supports both AM- and FM-KPFM modes, operate with a potential range up to ±10 V, with a reasonable spatial resolution. The applied voltage is from a few hundred millivolts to a few volts (approximately 1-2 V) for AC and DC, and the device is equipped with advanced control electronics and software for quantitative analysis. An integrated cooling and heating control with a large temperature range (from possibly -30°C up to +90°C) in both air and liquid environments was required to enable in-situ studies under variable atmospheric conditions. The system provides stable scanning, possibly flexible imaging modes of tapping and/or non-contacting, and compatibility with applications across metals and energy materials. Because of this, the system allows large samples with complex topography. The technical specification of the equipment and the tender process to be supplied was discussed in more detail in the invitation to tender documents. The object of the tender process was described in more detail in the invitation to tender documents.
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